ReVera is a leading provider of next-generation metrology used to monitor and control films and critical layers deployed in the semiconductor manufacturing process. ReVera has developed a unique process for measuring semiconductor-device thin films and layers. As semiconductor features become smaller and smaller, optical measurement and inspection techniques become less reliable. To address that problem, ReVera created VeraFlex II, a High-K Metal Gate (HKMG) Production Metrology system.
A leading supplier of wafer fabrication and services to the global semiconductor industry utilizes chemical vapor deposition (CVD), physical vapor deposition (PVD), electrochemical deposition (ECD), ultraviolet thermal processing (UVTP), and surface preparation equipment used in the manufacturing of semiconductors.